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- Material Analysis：Defect Analysis in Crystals
Material Analysis：Defect Analysis in Crystals
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Non-contact measurement of elastic properties and spin waves in addition to chemical composition and molecular structureBrillouin-Raman Microspectrometer Nanofinder
- Demo
NF07
Tokyo Instruments Inc.
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For scientific and R&D use. Electronically cooled at -80°C. Wideband models with wavelengths from 0.5 to 1.7 μm available.High sensitivity cooled InGaAs camera ZephIR1.7 / Alize1.7
PH02
Photon etc
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Obtains clear images in the near-infrared region from 0.9 to 2.2μm at 600fps!
Semiconductor inspection, food inspection, quality and production control, welding control, laser beam profiling, hyperspectral imaging, astronomical observation, fluorescence microscopy, security, drones, etc.High sensitivity low noise SWIR camera C-RED2 series
AD22
Andor Technology
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High sensitivity MCT camera with detection wavelength from 0.85 to 2.9 μm and -80°C electron cooling.Wide range high sensitivity SWIR camera ZephIR2.5 / ZephIR2.9
PH01
Photon etc
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Imaging at wavelengths from 1100 to 2500 nm. Frame rate 240 fps.Low-cost wide-range SWIR camera ZephIR 2.5e
PH11
Photon etc
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Long-Life™ Microchannel Plates exclusively from PHOTONIS provide sustained output up to fi ve times longer than other MCPs.Microchannel Plates
GL01
PHOTONIS
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PHOTONIS Advanced Performance Detectors (APDs) satisfy applications ranging from mass spectrometry to UV and X-ray astronomy.Advanced Performance Detectors (MCP)
GL04
PHOTONIS
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Radiation loss diagnostics in fusion plasmas. Quantitative measurement of soft X-ray to infrared radiation.Borometer system (for fusion plasma device diagnostics)
IA01
IPT-Albrecht
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400～1000nm, 1000～2500nm. High spatial resolutionHYPERSPECTRAL IMAGING CAMERA V-EOS, S-EOS
PH03
Photon etc
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High performance, Compact, Low cost Modular 3D Confocal RamanModular 3D Laser Raman Microspectroscopy System Nanofinder FLEX
NF02
Tokyo Instruments Inc.
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Maximum sensitivity and spatial resolution. Scanning imaging system. Combined analytical technologies for sample study on micron/submicron level.3D Laser Raman Microspectroscopy system Nanofinder 30A (ADVANCED TYPE)
NF06
Tokyo Instruments Inc.
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Best in the World Specifications3D Laser Raman Microspectroscopy System Nanofinder 30
NF05
Tokyo Instruments Inc.
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3D Confocal Raman, 2 lasers, fiber based, AFM combinedModular 3D Laser Raman Microspectroscopy System Nanofinder FLEX2
NF04
Tokyo Instruments Inc.
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High End Model for 3D Confocal Raman & TERS3D Laser Raman Microspectroscopy System Nanofinder HE
NF01
Tokyo Instruments Inc.
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Ultra-sensitive fluorescence spectrophotometer, SNR:>35,000:1, Multiple light sources and detectors mountFLS1000 Photoluminescence Spectrometer
ED02
EDINBURGH INSTRUMENTS
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Ideal for measurement of reflection and transmission characteristics of optical elements in the vacuum ultraviolet region Wavelength range: 120 to 350 nmVacuum Ultraviolet Spectrophotometer
MC07
McPherson
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Now it is possible to quickly and easily measure stress and structure in transparent materialsBirefringence Imaging system Exicor MicroImager
HN12
HINDS Instruments
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Maximum retardation sensitivity and measurement speed in the worldBirefringence measurement system Exicor series
HN01
HINDS Instruments
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Leading edge sensitivity and repeatabilityMueller polarimeter Exicor XT series
HN04
HINDS Instruments
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Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfideIR Birefringence measurement system Exicor PV-Si
HN13
HINDS Instruments
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Oblique incident angle birefringence measurement system for parallel faced optics and curved opticsOblique incident angle birefringence measurement system Exicor OIA
HN02
HINDS Instruments
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