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- Material Analysis：Crystal Structure Determination
Material Analysis：Crystal Structure Determination
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Long-Life™ Microchannel Plates exclusively from PHOTONIS provide sustained output up to fi ve times longer than other MCPs.Microchannel Plates
GL01
PHOTONIS
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PHOTONIS Advanced Performance Detectors (APDs) satisfy applications ranging from mass spectrometry to UV and X-ray astronomy.Advanced Performance Detectors (MCP)
GL04
PHOTONIS
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Electron impact ionization sources, Fluorescent display screens, Electron scrub sources, Sample discharge for SEMsELECTROGEN Electron Generator Arrays
GL03
PHOTONIS
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Pressure gauge developed for fusion energy (nuclear fusion) facilities.
Neutral gas pressure measurement in a magnetic field environment.ASDEX Pressure Gauge
IA02
IPT-Albrecht
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Ultra-sensitive fluorescence spectrophotometer, SNR:>35,000:1, Multiple light sources and detectors mountFLS1000 Photoluminescence Spectrometer
ED02
EDINBURGH INSTRUMENTS
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Ideal for first-time fluorescence lifetime measurements—a compact, domestically produced device combining ease of use with high sensitivity A simple, affordable entry-level model for researchers, smoothly guiding them into the world of fluorescence lifetime measurementFluorescence Lifetime Measurement Device: FLT-100
UK01
UKON Craft Science ltd.
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Joint development project. Fast and easy automatic measurement of band diagrams of various photonic structures.Photonic Band Diagram Microscope FA･CEED
- Demo
TTA01
Tokyo Institute of Technology
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Now it is possible to quickly and easily measure stress and structure in transparent materialsBirefringence Imaging system Exicor MicroImager
HN12
HINDS Instruments
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A new, compact, good cost-performance stokes polarimeterPOLSNAP Compact Stokes Polarimeter
HN14
HINDS Instruments
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Maximum retardation sensitivity and measurement speed in the worldBirefringence measurement system Exicor series
HN01
HINDS Instruments
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Leading edge sensitivity and repeatabilityMueller polarimeter Exicor XT series
HN04
HINDS Instruments
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Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfideIR Birefringence measurement system Exicor PV-Si
HN13
HINDS Instruments
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Oblique incident angle birefringence measurement system for parallel faced optics and curved opticsOblique incident angle birefringence measurement system Exicor OIA
HN02
HINDS Instruments
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A Versatile System for Making Highly Sensitive Polarization Measurements Across a Wavelength RangeResearch Grade Stokes Polarimeters
HN07
HINDS Instruments
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