Oblique incident angle birefringence measurement system for parallel faced optics and curved optics
Oblique incident angle birefringence measurement system Exicor OIA

HN02 Quotation・Inquiry
  • Outline
  • Related Documents

Outline

The Hinds™Instruments Exicor® OIA is the Premier Birefringence Measurement System for the evaluation of Lenses, Parallel Faced Optics and Curved Optics at normal and oblique incident angles. The system is built on Hinds Instruments award winning Photoelastic Modulator (PEM) based Exicor Birefringence Measurement technology. This next generation birefringence measurement system is providing the industry with new capabilities in the analysis and development of next generation lithographic lenses, lens blank and high value precious optics.

Get ADOBE READER

Adobe Reader is required to view the downloaded PDF files.
Please download it from the left banner and install it.

Last Updated Update Information Size Download

Frequently Asked Questions

Quotation・Inquiry

* Please give us an Inquiry No.HN02

Telephone *Please give us an Inquiry No.
Head Office 81-3-3686-4711
Osaka Office 81-6-6393-7411