Maximum retardation sensitivity and measurement speed in the world
Birefringence measurement system Exicor series

Outline

Exicor® birefringence measurement technology, introduced in 1999 with the model 150AT, provides leading edge customers with the world’s most technically advanced, production-worthy capability for measuring birefringence. Unprecedented sensitivity in the Exicor systems is a product of Hinds Instruments’ PEMLabs™ Techology that pioneered the ultra-low birefringence photoelastic modulator (PEM). The award winning sensitivity of Exicor is enhanced by the modulation purity of the PEM, a result of the resonant nature of the modulator.Exicor measures retardation integrated along an optical path through the optical sample under investigation. It is designed to measure and display both the magnitude and orientation of the retardation axis.