Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfide
IR Birefringence measurement system Exicor PV-Si

Outline

Hinds Instruments’ Near Infrared Exicor® Birefringence Measurement System 500 Si Ingot is an extension of the workhorse platform of the Exicor birefringence measurement system family of products. This system employs high quality, symmetrical photoelastic modulators, a 1550 nm laser, and a Ge avalanche photodiode detector to enable high accuracy birefringence measurements for Si materials used in both the photovoltaic and semiconductor industries. In addition to Si, materials such as sapphire, silicon carbide, zinc selenide, cadmium sulfide can also be measured with this system. The 500 Si Ingot model is robust and versatile, built to hold and measure a 500mm length of raw ingot up to diameters of 8 inches. The system design and intuitive automated scanning software make this product the best choice for material improvement, R&D efforts and day-in-day-out evaluation of raw Si ingots as well as other high tech materials.