Analysis Equipments：Polarization Analysis

High speed polarization camera
- Demo
- Spec
PHN01

Photonic Lattice, Inc.
Now it is possible to quickly and easily measure stress and structure in transparent materials
Birefringence Imaging system Exicor MicroImager
HN12

HINDS Instruments
A new, compact, good cost-performance stokes polarimeter
POLSNAP Compact Stokes Polarimeter
HN14

HINDS Instruments
Maximum retardation sensitivity and measurement speed in the world
Birefringence measurement system Exicor series
HN01

HINDS Instruments
Leading edge sensitivity and repeatability
Mueller polarimeter Exicor XT series
HN04

HINDS Instruments
Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfide
IR Birefringence measurement system Exicor PV-Si
HN13

HINDS Instruments
Oblique incident angle birefringence measurement system for parallel faced optics and curved optics
Oblique incident angle birefringence measurement system Exicor OIA
HN02

HINDS Instruments
A Versatile System for Making Highly Sensitive Polarization Measurements Across a Wavelength Range
Research Grade Stokes Polarimeters
HN07

HINDS Instruments