Analysis Equipments：Polarization Analysis

High speed polarization camera
- Demo
- Spec
PHN01

Photonic Lattice, Inc.
Now it is possible to quickly and easily measure stress and structure in transparent materials
Birefringence Imaging system Exicor MicroImager
HN12

HINDS Instruments
A new, compact, good cost-performance stokes polarimeter
POLSNAP Compact Stokes Polarimeter
HN14

HINDS Instruments
Direct polarization measurement for white light with high wavelength resolution.
Wavelength range is 400 - 800 nm.
Spectroscopic polarimeter Poxi-spectra
PX01

Tokyo Instruments Inc.
Birefringence measurement for VIS range.
0 - 100,000nm retardation

Spectroscopic birefringence polarimeter Poxi-spectra
PX02

Tokyo Instruments Inc.
Muller matrix measurement for VIS range.
Mueller matrix spectroscopic polarimeter Poxi-spectra
PX03

Tokyo Instruments Inc.
Maximum retardation sensitivity and measurement speed in the world
Birefringence measurement system Exicor series
HN01

HINDS Instruments
Leading edge sensitivity and repeatability
Mueller polarimeter Exicor XT series
HN04

HINDS Instruments
Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfide
IR Birefringence measurement system Exicor PV-Si
HN13

HINDS Instruments
Oblique incident angle birefringence measurement system for parallel faced optics and curved optics
Oblique incident angle birefringence measurement system Exicor OIA
HN02

HINDS Instruments
A Versatile System for Making Highly Sensitive Polarization Measurements Across a Wavelength Range
Research Grade Stokes Polarimeters
HN07

HINDS Instruments

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