Dramatic reduction in tact time for production lines and pre-shipment inspection of optical device manufacturers.
Maximum 185 to 5200 nm contact measurement in a single unit.
For flat optical elements (filters, mirrors, PBS cubes).
New InGaAs detector upgrade (lower noise and longer stable baseline).
New PHTORON RT model (additive dispersion Zermit-Turner optical system).
Optical density up to OD8, high resolution 0.06 nm, wavelength range 350 - 2000 nm transmission measurement.
For optical element manufacturers' production lines and pre-shipment inspection of products, significantly reducing takt time.
LWIR (Long Wave Infrared) measurement from 7.5 to 12.0 μm, fully automatic switching of reflection/transmission/polarization/angle resolution.
For optical lens manufacturer's production line and pre-shipment inspection of products.
Transmission measurement of single lens and camera lens, measurement wavelength range 2.7 - 5.2 μm, continuous measurement.
For optical lens manufacturer's production line and pre-shipment inspection of products, drastically reducing takt time.
Transmission measurement of single lens and camera lens & reflection measurement of single lens.
Continuous measurement up to 185 - 1700 nm with a single unit.
Fully automatic on-axis/off-axis measurement of reflectance (coating evaluation).
Ideal for measurement of reflection and transmission characteristics of optical elements in the vacuum ultraviolet region Wavelength range: 120 to 350 nm