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  • Maximum retardation sensitivity and measurement speed in the world

    Birefringence measurement system Exicor series

    HN01

    HINDS Instruments

  • Leading edge sensitivity and repeatability

    Mueller polarimeter Exicor XT series

    HN04

    HINDS Instruments

  • Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfide

    IR Birefringence measurement system Exicor PV-Si

    HN13

    HINDS Instruments

  • Oblique incident angle birefringence measurement system for parallel faced optics and curved optics

    Oblique incident angle birefringence measurement system Exicor OIA

    HN02

    HINDS Instruments

  • A Versatile System for Making Highly Sensitive Polarization Measurements Across a Wavelength Range

    Research Grade Stokes Polarimeters

    HN07

    HINDS Instruments

  • ABREX:Soft-chemo-mechanical fingertip and hand abrasion

    ABREX:Soft-chemo-mechanical fingertip・hand abrasion

    • Demo

    IW01

    INNOWEP GmbH

  • Dyna-SPA: Fastest and dynamic scratch, punch and abrasion tests

    Dyna-SPA: Fastest and dynamic scratch, punch and abrasion tests

    • Demo

    IW02

    INNOWEP GmbH

  • UST:Universal Surface Tester

    UST:Universal Surface Tester

    IW03

    INNOWEP GmbH

  • TRACEiT: Fast, mobile, optical and non-contact 3D surface analyzer

    TRACEiT: Fast, mobile, optical and non-contact 3D surface analyzer

    IW04

    INNOWEP GmbH

  • TEPERADER: Mobile, fast and in-situ solution for real-time analysis of surface coatings

    TEPERADER: Mobile, fast and in-situ solution for real-time analysis of surface coatings

    IW06

    INNOWEP GmbH

  • Accumulated UV Meter UIT-250
    Central wavelength 254nm, 365nm, 405nm

    Accumulated UV Meter UIT-250

    UD03

    USHIO

  • EPR (ESR) Spectroscopy
    Delivered more than 200 units worldwide, minimum detection concentration of 30nM

    EPR (ESR) Spectroscopy

    AX01

    ADANI

  • Probe Raman analyzer for gas analysis
    Atmospheric pressure multi-gas analysis (H2, N2, CO2, NO2, CH4, etc.), flow measurement available.
    High sensitivity, low noise, high S/N measurement with high performance cooled CCD detector.

    Probe Raman analyzer for gas analysis GasRaman-NOCH

    EW03

    Enwave Optronics,Inc.

  • Hydrogen-Sensitive Thermal Desorption Spectroscopy System HEMTO-TDS
    High sensitivity hydrogen detection, Non-contact temperature control by laser heating

    Hydrogen-Sensitive Thermal Desorption Spectroscopy System HEMTO-TDS

    US02

    UNISOKU

  • Trace Level Gas Analyzer HALO3 series
    Powerful Cavity Ring-Down Gas Analyzer

    Trace Level Gas Analyzer HALO3 series

    TO01

    Tiger Optics

  • Trace Level Moisture Analyzer Spark H2O
    Powerful Cavity Ring-Down Moisture Analyzer

    Trace Level Moisture Analyzer Spark H₂O

    TO05

    Tiger Optics

  • Portable FTIR Spectroscopy Unit with Gas Cell GASEX OEM
    Simultaneous measurement of multiple gas spectra (CO2, H2O, CO, NH3, NO, NO2, N2O, SO2, CH4, HF, HCl, VOC, etc.) Multi-bandpass heating cell (20 to 200°C) with bandwidth range up to 2 to 16 μm (5000 to 650 cm-1) Detection limit ppm level GASEX OEM Standard / GASEX OEM SC for high concentration % level

    Portable FTIR Spectroscopy Unit with Gas Cell GASEX OEM

    AR10

    ARCoptix S.A.

  • Kelvin probe systems
    High sensitivity and high accuracy measurement of work function and surface potential. Wide range mapping is also possible.

    Kelvin probe systems

    KT01

    KP Technology

  • Photoemission in air systems
    Measures work function and ionization potential in the air. Evaluates the electronic state of OLEDs.

    Photoemission in air systems

    KT02

    KP Technology

  • Environmental Kelvin Probe Systems

    Environmental Kelvin Probe Systems

    KT03

    KP Technology

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