- Home
- Products
- Product Search
- Search Results
Search Results 338Search results
-
New PHTORON RT model (additive dispersion Zermit-Turner optical system).
Optical density up to OD8, high resolution 0.06 nm, wavelength range 350 - 2000 nm transmission measurement.High Optical Density OD8 Fully Automatic Spectrophotometer PHOTON RT 0420 Ultra
- Demo
- In Stock
ES03
EssentOptics Ltd.
-
For optical element manufacturers' production lines and pre-shipment inspection of products, significantly reducing takt time.
LWIR (Long Wave Infrared) measurement from 7.5 to 12.0 μm, fully automatic switching of reflection/transmission/polarization/angle resolution.Fully automated spectrophotometer dedicated to LWIR optical elements PHOTON RT 7512
- Demo
- In Stock
ES04
EssentOptics Ltd.
-
For optical lens manufacturer's production line and pre-shipment inspection of products.
Transmission measurement of single lens and camera lens, measurement wavelength range 2.7 - 5.2 μm, continuous measurement.Spectrophotometer for MWIR Lenses LINZA 2752
- Demo
- In Stock
ES05
EssentOptics Ltd.
-
For optical lens manufacturer's production line and pre-shipment inspection of products, drastically reducing takt time.
Transmission measurement of single lens and camera lens & reflection measurement of single lens.
Continuous measurement up to 185 - 1700 nm with a single unit.
Fully automatic on-axis/off-axis measurement of reflectance (coating evaluation).LINZA 150 Spectrophotometer for lens measurement
ES02
EssentOptics Ltd.
-
Ideal for measurement of reflection and transmission characteristics of optical elements in the vacuum ultraviolet region Wavelength range: 120 to 350 nmVacuum Ultraviolet Spectrophotometer
MC07
McPherson
-
Joint development project. Fast and easy automatic measurement of band diagrams of various photonic structures.Photonic Band Diagram Microscope FA･CEED
- Demo
TTA01
Tokyo Institute of Technology
-
-
Now it is possible to quickly and easily measure stress and structure in transparent materialsBirefringence Imaging system Exicor MicroImager
HN12
HINDS Instruments
-
A new, compact, good cost-performance stokes polarimeterPOLSNAP Compact Stokes Polarimeter
HN14
HINDS Instruments
-
Maximum retardation sensitivity and measurement speed in the worldBirefringence measurement system Exicor series
HN01
HINDS Instruments
-
Leading edge sensitivity and repeatabilityMueller polarimeter Exicor XT series
HN04
HINDS Instruments
-
Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfideIR Birefringence measurement system Exicor PV-Si
HN13
HINDS Instruments
-
Oblique incident angle birefringence measurement system for parallel faced optics and curved opticsOblique incident angle birefringence measurement system Exicor OIA
HN02
HINDS Instruments
-
A Versatile System for Making Highly Sensitive Polarization Measurements Across a Wavelength RangeResearch Grade Stokes Polarimeters
HN07
HINDS Instruments
-
-
-
-
-
-
UV to visible to IR to THz region
It corresponds to the light distribution measurement of large area light emitting objects.Luminous flux Angle Distribution Analyzer LADA-100
PG05
PRECISE GAUGES co.Ltd.