Search Results | Products - TOKYOINSTRUMENTS,INC.

High accuracy and precision of measurements, Low detection limit of elements

LEA-S500 Elemental Analyzer

SO06

SOL instruments Ltd (SOLAR TII)

Modular design with high expandability and selectivity, atmosphere control (under reduced/pressurized pressure, inert gas atmosphere)
Double/multipulse Nd:YAG laser available (optional wavelengths 532, 355, 266 nm)
High resolution 2D chemical mapping, detection limit 1 to 100 ppm

Sci-Trace, a multi-functional extended LIBS system

ATM01

AtomTrace

Batch measurement of spectra, fast wavelength scanning, low sample damage

Picosecond SFG Spectrometer

SFG01

EKSPLA, TII

Non-destructive, non-contact molecular vibration analysis of surfaces and interfaces (solids-liquids-gases) for all solid, liquid, and gaseous surfaces and interfaces Demo measurements available

Femtosocond SFG Spectrometer

Demo

SFG02

EKSPLA, TII

High sensitivity plasma and combustion analyzed system

Analyze system by laser induced fluorescence

TI50

Tokyo Instruments Inc.

Transient absorption measurement system of the miri-nano second order

Laser flash photolysis

TI51

Tokyo Instruments Inc.

Dramatic reduction in tact time for production lines and pre-shipment inspection of optical device manufacturers.
Maximum 185 to 5200 nm contact measurement in a single unit.
For flat optical elements (filters, mirrors, PBS cubes).
New InGaAs detector upgrade (lower noise and longer stable baseline).

Fully automated spectrophotometer dedicated to optical elements PHOTON RT

Demo
In Stock

ES01

EssentOptics Ltd.

New PHTORON RT model (additive dispersion Zermit-Turner optical system).
Optical density up to OD8, high resolution 0.06 nm, wavelength range 350 - 2000 nm transmission measurement.

High Optical Density OD8 Fully Automatic Spectrophotometer PHOTON RT 0420 Ultra

Demo
In Stock

ES03

EssentOptics Ltd.

For optical element manufacturers' production lines and pre-shipment inspection of products, significantly reducing takt time.
LWIR (Long Wave Infrared) measurement from 7.5 to 12.0 μm, fully automatic switching of reflection/transmission/polarization/angle resolution.

Fully automated spectrophotometer dedicated to LWIR optical elements PHOTON RT 7512

Demo
In Stock

ES04

EssentOptics Ltd.

For optical lens manufacturer's production line and pre-shipment inspection of products.
Transmission measurement of single lens and camera lens, measurement wavelength range 2.7 - 5.2 μm, continuous measurement.

Spectrophotometer for MWIR Lenses LINZA 2752

Demo
In Stock

ES05

EssentOptics Ltd.

For optical lens manufacturer's production line and pre-shipment inspection of products, drastically reducing takt time.
Transmission measurement of single lens and camera lens & reflection measurement of single lens.
Continuous measurement up to 185 - 1700 nm with a single unit.
Fully automatic on-axis/off-axis measurement of reflectance (coating evaluation).

LINZA 150 Spectrophotometer for lens measurement

ES02

EssentOptics Ltd.

Ideal for measurement of reflection and transmission characteristics of optical elements in the vacuum ultraviolet region Wavelength range: 120 to 350 nm