- Home
- Products
- Product Search
- Search Results
Search Results 335Search results
-
For optical element manufacturers' production lines and pre-shipment inspection of products, significantly reducing takt time.
LWIR (Long Wave Infrared) measurement from 7.5 to 12.0 μm, fully automatic switching of reflection/transmission/polarization/angle resolution.Fully automated spectrophotometer dedicated to LWIR optical elements PHOTON RT 7512
- Demo
- In Stock
ES04
EssentOptics Ltd.
-
For optical lens manufacturer's production line and pre-shipment inspection of products.
Transmission measurement of single lens and camera lens, measurement wavelength range 2.7 - 5.2 μm, continuous measurement.Spectrophotometer for MWIR Lenses LINZA 2752
- Demo
- In Stock
ES05
EssentOptics Ltd.
-
For optical lens manufacturer's production line and pre-shipment inspection of products, drastically reducing takt time.
Transmission measurement of single lens and camera lens & reflection measurement of single lens.
Continuous measurement up to 185 - 1700 nm with a single unit.
Fully automatic on-axis/off-axis measurement of reflectance (coating evaluation).LINZA 150 Spectrophotometer for lens measurement
ES02
EssentOptics Ltd.
-
Ideal for measurement of reflection and transmission characteristics of optical elements in the vacuum ultraviolet region Wavelength range: 120 to 350 nmVacuum Ultraviolet Spectrophotometer
MC07
McPherson
-
Joint development project. Fast and easy automatic measurement of band diagrams of various photonic structures.Photonic Band Diagram Microscope FA･CEED
- Demo
TTA01
Tokyo Institute of Technology
-
-
Now it is possible to quickly and easily measure stress and structure in transparent materialsBirefringence Imaging system Exicor MicroImager
HN12
HINDS Instruments
-
A new, compact, good cost-performance stokes polarimeterPOLSNAP Compact Stokes Polarimeter
HN14
HINDS Instruments
-
Maximum retardation sensitivity and measurement speed in the worldBirefringence measurement system Exicor series
HN01
HINDS Instruments
-
Leading edge sensitivity and repeatabilityMueller polarimeter Exicor XT series
HN04
HINDS Instruments
-
Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfideIR Birefringence measurement system Exicor PV-Si
HN13
HINDS Instruments
-
Oblique incident angle birefringence measurement system for parallel faced optics and curved opticsOblique incident angle birefringence measurement system Exicor OIA
HN02
HINDS Instruments
-
A Versatile System for Making Highly Sensitive Polarization Measurements Across a Wavelength RangeResearch Grade Stokes Polarimeters
HN07
HINDS Instruments
-
-
-
-
-
-
UV to visible to IR to THz region
It corresponds to the light distribution measurement of large area light emitting objects.Luminous flux Angle Distribution Analyzer LADA-100
PG05
PRECISE GAUGES co.Ltd.
-
Central wavelength 450nm±10nm, high fiber power up to 12W, high stability by precision control system
Low cost, special specifications such as high repetition pulse (modulation) specifications are availableBlue High Power Semiconductor Laser PLS Series
PG06
PRECISE GAUGES co.Ltd.