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Specifically designed for use with high frequency optical signals including those generated in Photoelastic Modulator (PEM) applicationsSilicon Photodetector and Germanium Photodetector
HN09
HINDS Instruments
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Ｈigh frequency optical signals including those generated in Photoelastic Modulator (PEM) applicationsAvalanche Photodiode Photodetector Module
HN10
HINDS Instruments
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No moving parts, Minimal heat generation, Wide acceptance angleHigh Speed Optical Chopper
HN11
HINDS Instruments
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Now it is possible to quickly and easily measure stress and structure in transparent materialsBirefringence Imaging system Exicor MicroImager
HN12
HINDS Instruments
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A new, compact, good cost-performance stokes polarimeterPOLSNAP Compact Stokes Polarimeter
HN14
HINDS Instruments
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Maximum retardation sensitivity and measurement speed in the worldBirefringence measurement system Exicor series
HN01
HINDS Instruments
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Leading edge sensitivity and repeatabilityMueller polarimeter Exicor XT series
HN04
HINDS Instruments
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Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfideIR Birefringence measurement system Exicor PV-Si
HN13
HINDS Instruments
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Oblique incident angle birefringence measurement system for parallel faced optics and curved opticsOblique incident angle birefringence measurement system Exicor OIA
HN02
HINDS Instruments
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A Versatile System for Making Highly Sensitive Polarization Measurements Across a Wavelength RangeResearch Grade Stokes Polarimeters
HN07
HINDS Instruments