Fast and Easy Automatic Measurement of Band Diagrams of Various Photonic Structures
Tokyo Instruments (Head Office: Edogawa-ku, Tokyo, President: Mr. Kenichi Kawamura) will introduce "FA･CEED", a product jointly developed with Tokyo Institute of Technology (Meguro-ku, Tokyo, President: Dr. Kazuya Masu), which enables the fast and easy measurement of the entire band diagram of various photonic structures. The sales will start from early June 2021.
Conventional evaluation methods generally require the construction of an optical system suitable for each sample, as well as the adjustment of the optical system, measurement time, evaluation time, and other time-consuming observations. The new "FA･CEED" system solves all these problems and makes it possible to easily and quickly measure the physical properties of various photonic structures.
Photonic structures (i.e., microstructures smaller than the wavelength of light, arranged with a certain periodicity) enable different types of light manipulation by utilizing the interaction between light and matter inside the structure. Typical structures include photonic crystals, topological photonic crystals, and metamaterials, which are realized by microfabrication of semiconductors using nano processing technology. The photonic band diagram is one of the important indicators to determine the optical properties of such structures. The "FA･CEED" system can measure the photonic band diagram at high speed, making it possible to predict various optical phenomena observed in numerous photonic structures, such as the slow light effect, polarization-dependent unidirectional propagation, and negative refractive index.
By using "FA･CEED", the characteristics of photonic structures can be clarified and used as an index for exploring fundamental properties. It also facilitates the design of optical devices that employ various photonic structures, leading to the expansion of related markets and the development of new research areas using photonic structures.
■Successful development and commercialization of a photonic band diagram microscope
■High-speed measurement of band diagrams of photonic structures in local areas
■Easy research and development of optical devices using various photonic structures
To Photonic Band Diagram Microscope "FA･CEED" Product Page
This device was developed in collaboration with Assistant Professor Tomohiro Amemiya of the Tokyo Institute of Technology through the research project "Development of novel properties of topological states based on artificial graphene" in the area of "Creation of materials and devices with innovative functions based on topological materials science" of CREST, a strategic creative research promotion project of the Japan Science and Technology Agency.