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Featured Products

  • Real Time Wheels Geometry Measurement 3DWHEEL

    Real Time Wheels Geometry Measurement 3DWHEEL

    3D LASER MEASUREMENT MACHINE

  • Real Time Wheels Geometry Measurement 3DWHEEL

    Real Time Wheels Geometry Measurement 3DWHEEL

  • Full wafer cathodoluminescence system Säntis 300

    Full wafer cathodoluminescence system Säntis 300

  • Microwave chemosynthesis reactor AURORA

    Microwave chemosynthesis reactor AURORA

  • Super-Resolution Optical Microscopy NANORO

  • Cryogen-free dilution refrigerator

    Cryogen-free dilution refrigerator

  • Dilatometer

    Dilatometer

  • VFM Microwave Oven (for lithium ion battery drying)

    VFM Microwave Oven (for lithium ion battery drying)

  • 3D Laser Raman Microspectroscopy system Nanofinder 30A (ADVANCED TYPE)

    3D Laser Raman Microspectroscopy system Nanofinder® 30A (ADVANCED TYPE)

    Maximum sensitivity and spatial resolution. Scanning imaging system. Combined analytical technologies for sample study on micron/submicron level.

  • Particle Analyzers

    Particle Analyzers

  • Particle Monitoring and Control System

    Particle Monitoring and Control System

  • Time Of Flight Momentum Microscope

    Time Of Flight Momentum Microscope

  • VSM System (Vibrating Sample Magnetometer)

    VSM System (Vibrating Sample Magnetometer)

  • ELECTRON BEAM INDUCED CURRENT (EBIC) IMAGING SYSTEMS

    ELECTRON BEAM INDUCED CURRENT (EBIC) IMAGING SYSTEMS

  • UHV Kelvin Probe Systems

    UHV Kelvin Probe Systems

  • X-ray source, Ultraviolet source

    X-ray source, Ultraviolet source

  • Compact Low Energy Electron And Photoelectron Emission Microscope

    Compact Low Energy Electron And Photoelectron Emission Microscope

  • High throughput and high efficiency Cathodoluminescence for STEM Mönch 4107

    Monch 4107- High throughput and high efficiency Cathodoluminescence system for STEM

  • Environmental Kelvin Probe Systems

    Environmental Kelvin Probe Systems

  • Ultimate Particle Analyzer EyeTech

    Ultimate Particle Analyzer EyeTech

    No requirement to enter sample properties on particle analysis

  • EnviroESCA Electron Spectroscopy for Chemical Analysis under Environmental Conditions

    EnviroESCA Electron Spectroscopy for Chemical Analysis under Environmental Conditions

    Fully automated measurement environment

  • Cryogen-Free Measurements System

    Cryogen-Free Measurements System

    Fully automated measurement environment

  • Cathodoluminescence System Attolight CL

    Cathodoluminescence System Attolight CL

    High Space and Time Resolution

  • Kelvin probe systems

    Kelvin probe systems

  • Photoemission in air systems

    Photoemission in air systems

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