-
Lasers
-
Photodetectors/Analyzers for photoelectron spectroscopy
- Spectroscopy Array Detectors (CCD, EMCCD, ICCD, InGaAs)
- High Speed/High Sensitivity Cameras (UV～IR)
- Photon Detectors/Counters
- Infrared Detectors (MCT etc.)
- Universal Detectors (PD, APD etc.)
- THz Detectors
- X-Ray/Electron Beam Detectors (CCD, MCP etc.)
- SPECS Energy Analyzer
- Bolometer
- Detector Accessories
-
Analysis Equipments
- Polarization Analysis
- Material and Surface testing
- LED/Organic EL Evaluation
- Photometers, Illuminance Meters, Colorimeters
- Magnetic Resonance Analysis (ESR)
- Gas Detection/Analysis
- Scanning Probe Microscopy (AFM/STM)
- Work Function・Surface Potential Measurement
- Cathodeluminescence
- Electron Beam Induced Current(EBIC)
- Melting Point Measurement
- Low temperature material characterization
- Substance Identification
- Electron Spectroscopy for Chemical Analysis
- Particle Analysis
- Automatic reaction and synthesis equipment
- calorimeter
- Luminous flux angular distribution measurement
-
Laser Accessories
-
Spectrometers
-
Optics
-
Laser Optoelectronics
-
Spectroscopy
-
Bio-related Products
-
Light Sources/Electron Sources
- Lamp Sources (D2, Xe, Hg, HgXe, Halogen etc.)
- Tunable Light Sources (Lamp)
- Wavelength Calibration Lamps (Hg, Na etc.)
- Standard Light Sources of Spectral Irradiance
- Solar Simulators
- Soft X-ray/VUV Light Sources
- Electron Sources (Multi Array Electron Source etc.)
- THz Light Sources
- Microwave Oven
- X-ray source, UV source
-
Electrical Measurement
-
Microscope
-
Micromachining/Manufacturing
-
mechanics
-
Testing Apparatus