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Product NO : TII-1 |
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Spectroscopic analysis with high spatial resolution imaging Nanofinder®FLEX |
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Si device application
With Nanofinder®FLEX high
resolution Raman imaging and presize Raman shift
measurement are readily available.
High resolution Raman image with oil immersion
objective lens (100x N.A. 1.4)
High resolution Raman image with air objective lens
(100x N.A. 0.95)
Fine Si Raman shift measurement
TII original "FitPeak" software was applied.
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Latest news
New AFM-Raman combined system
New AFM-Raman combined system for simultanious Raman and topography imaging
Product "Nanofinder® FLEX" Catalog
Simple operation and low
cost with all the basic features of our top
of the line Nanofinder® 30
system.
Data "Strained Si Measurement" Update.
Spatial Resolution <130
nm,Strain 0.01% (0.1cm -1 shift),
High Sensitivity.
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