Depth analysis of laminated film with Nanofinder^®FLEX

With confocal layout spectral depth profile can be measured by moving focus position of laser beam inside Laminated film.

Spectral depth profile image.

Horizontal axis - Raman shift,
Vertical axis - depth in laminated film.

Different spectra were measured along the depth direction.

Raman spectra for each material.

Right hand profiles are intensity depth profiles for specific peak (orange squares). These 3 layers can be easily resolved with Nanofinder^®FLEX.