TOKYO INSTRUMENTS,INC. Japanese
Home About Us Contact Us Sitemap Sitemap
Home > Nanofinder®30
Product NO : TII-1

3D Raman Microscopy System, Micro-Nano Scale Micro spectroscopy Nanofinder®30

Combined Confocal Raman/AFM system

Confocal Raman and AFM topography images are available simultaneously from the same sample area.

The AFM head is specially designed for TERS application - high NA objective lens for simultaneous operation: NA=1.4 for bottom illumination, 0.7 for top illumination, 0.42 for side illumination geometries. Read more...

Bottom illumination scheme layout



Single-walled Carbon Nanotubes (SWCNT)
Raman image at 1593 cm-1 (G-band) Raman image at 173 cm-1(RBM)
Raman image at 1351 cm-1 (D-band) AFM topography image



Raman spectra from different locations.
Excitation laser: 488 nm, PowerF1.5 mW
Objective lens: 100xOil, N.A.1.3

Raman spectra from points 1-6, shown in AFM topography image. Points 1-6 show Raman spectra typical for semiconducting type SWCNT. Points 7, 8 do not show Raman spectra with 488 excitation laser wavelength. They revealed metallic type SWCNT Raman spectra when the excitation was done with 633 nm laser wavelength.

TERS (Tip Enhanced Raman Spectroscopy) Capability

TERS imaging

The spatial resolution of the scanned image can be improved with using TERS technology, as shown in right.

Confocal Raman spectrum of Carbon nanotube with Si tip approached




Sample: Carbon nanotubes (CNT)

Raman image at G-band (1593 cm-1)

Raman imaging below diffraction limit

Resolution of 50 nm is achievable with using TERS technology.

Sample: Silver particles distribution on CNT layer. Raman image at CNT G-band line (1593 cm-1).

Raman image of CNT raw material (bundles mixture)

Laser wavelength: 488 nm,
Laser power: 2 mW,
Measurement time: 10 min.
Scale bar (200 nm) shows minimum resolution level for confocal imaging.
Products
 Latest news
New AFM-Raman combined system
New AFM-Raman combined system for simultanious Raman and topography imaging
More
Product "Nanofinder® FLEX" Catalog
Simple operation and low cost with all the basic features of our top of the line Nanofinder®30 system.
More
Data "Strained Si Measurement" Update.
Spatial Resolution <130 nm,Strain 0.01% (0.1cm-1 shift), High Sensitivity.
More
(C)TOKYOINSTRUMENTS,INC.All Rights Reserved.