Semiconductor Display：Strain/Polarization Evaluation

Non-contact measurement of elastic properties and spin waves in addition to chemical composition and molecular structure
Brillouin-Raman Microspectrometer Nanofinder
- Demo
NF07

Tokyo Instruments Inc.
Pure and Efficient Polarization Modulation
Photoelastic modulator
HN08

HINDS Instruments
High performance, Compact, Low cost Modular 3D Confocal Raman
Modular 3D Laser Raman Microspectroscopy System Nanofinder FLEX
NF02

Tokyo Instruments Inc.
Maximum sensitivity and spatial resolution. Scanning imaging system. Combined analytical technologies for sample study on micron/submicron level.
3D Laser Raman Microspectroscopy system Nanofinder 30A (ADVANCED TYPE)
NF06

Tokyo Instruments Inc.
Best in the World Specifications
3D Laser Raman Microspectroscopy System Nanofinder 30
NF05

Tokyo Instruments Inc.
3D Confocal Raman, 2 lasers, fiber based, AFM combined
Modular 3D Laser Raman Microspectroscopy System Nanofinder FLEX2
NF04

Tokyo Instruments Inc.
High End Model for 3D Confocal Raman & TERS
3D Laser Raman Microspectroscopy System Nanofinder HE
NF01

Tokyo Instruments Inc.
High speed polarization camera
- Demo
- Spec
PHN01

Photonic Lattice, Inc.
Now it is possible to quickly and easily measure stress and structure in transparent materials
Birefringence Imaging system Exicor MicroImager
HN12

HINDS Instruments
Direct polarization measurement for white light with high wavelength resolution.
Wavelength range is 400 - 800 nm.
Spectroscopic polarimeter Poxi-spectra
PX01

Tokyo Instruments Inc.
Birefringence measurement for VIS range.
0 - 100,000nm retardation

Spectroscopic birefringence polarimeter Poxi-spectra
PX02

Tokyo Instruments Inc.
Muller matrix measurement for VIS range.
Mueller matrix spectroscopic polarimeter Poxi-spectra
PX03

Tokyo Instruments Inc.
Maximum retardation sensitivity and measurement speed in the world
Birefringence measurement system Exicor series
HN01

HINDS Instruments
Leading edge sensitivity and repeatability
Mueller polarimeter Exicor XT series
HN04

HINDS Instruments
Birefringence measurement for Si, sapphire, silicon carbide, zinc selenide, cadmium sulfide
IR Birefringence measurement system Exicor PV-Si
HN13

HINDS Instruments
Oblique incident angle birefringence measurement system for parallel faced optics and curved optics
Oblique incident angle birefringence measurement system Exicor OIA
HN02

HINDS Instruments
A Versatile System for Making Highly Sensitive Polarization Measurements Across a Wavelength Range
Research Grade Stokes Polarimeters
HN07

HINDS Instruments
TRACEiT: Fast, mobile, optical and non-contact 3D surface analyzer
IW04

INNOWEP GmbH
TEPERADER: Mobile, fast and in-situ solution for real-time analysis of surface coatings
IW06

INNOWEP GmbH
Fully automated measurement environment
EnviroESCA Electron Spectroscopy for Chemical Analysis under Environmental Conditions
SPC01

SPECS GmbH
Multi-channel measurement platform
Quantum transport measurement system Nanonis Tramea
SPC09

SPECS GmbH