Semiconductor Display：Material Analysis

Non-contact measurement of elastic properties and spin waves in addition to chemical composition and molecular structure
Brillouin-Raman Microspectrometer Nanofinder
- Demo
NF07

Tokyo Instruments Inc.
Next Generation Electron Momentum Spectrometer for Small Spot ARPES and Momentum Microscopy
Electrostatic hemispherical electron momentum spectrometer KREIOS 150
SPC07

SPECS GmbH
Microwave solutions for the next generation
VariWave Variable Frequency Microwave Laboratory Oven
LM01

LAMBDA Technologies
Imaging of functional and molecular features in deep tissue.
High resolution acoustic imaging meeting full flexibility of conventional microscopy.
easyPAM Photoacoustic Microscopy, easySAM Acoustic Microscope
KI01

Kibero
High performance, Compact, Low cost Modular 3D Confocal Raman
Modular 3D Laser Raman Microspectroscopy System Nanofinder FLEX
NF02

Tokyo Instruments Inc.
Maximum sensitivity and spatial resolution. Scanning imaging system. Combined analytical technologies for sample study on micron/submicron level.
3D Laser Raman Microspectroscopy system Nanofinder 30A (ADVANCED TYPE)
NF06

Tokyo Instruments Inc.
Best in the World Specifications
3D Laser Raman Microspectroscopy System Nanofinder 30
NF05

Tokyo Instruments Inc.
3D Confocal Raman, 2 lasers, fiber based, AFM combined
Modular 3D Laser Raman Microspectroscopy System Nanofinder FLEX2
NF04

Tokyo Instruments Inc.
High End Model for 3D Confocal Raman & TERS
3D Laser Raman Microspectroscopy System Nanofinder HE
NF01

Tokyo Instruments Inc.
Ultra-sensitive fluorescence spectrophotometer, SNR:>35,000:1, Multiple light sources and detectors mount
FLS1000 Photoluminescence Spectrometer
ED02

EDINBURGH INSTRUMENTS
High accuracy and precision of measurements, Low detection limit of elements
LEA-S500 Elemental Analyzer
SO06

SOL instruments Ltd (SOLAR TII)
Joint development project. Fast and easy automatic measurement of band diagrams of various photonic structures.
Photonic Band Diagram Microscope FA･CEED
- Demo
TTA01

Tokyo Institute of Technology
Leading edge sensitivity and repeatability
Mueller polarimeter Exicor XT series
HN04

HINDS Instruments
ABREX:Soft-chemo-mechanical fingertip･hand abrasion
- Demo
IW01

INNOWEP GmbH
Dyna-SPA: Fastest and dynamic scratch, punch and abrasion tests
- Demo
IW02

INNOWEP GmbH
UST:Universal Surface Tester
IW03

INNOWEP GmbH
TRACEiT: Fast, mobile, optical and non-contact 3D surface analyzer
IW04

INNOWEP GmbH
TEPERADER: Mobile, fast and in-situ solution for real-time analysis of surface coatings
IW06

INNOWEP GmbH
High Space and Time Resolution
Cathodoluminescence System Attolight CL
TT01

attolight
Monch 4107- High throughput and high efficiency Cathodoluminescence system for STEM
TT02

attolight
Fully automated measurement environment
Cryogen-Free Measurements System
CG01

Cryogenic Limited
Fully automated measurement environment
EnviroESCA Electron Spectroscopy for Chemical Analysis under Environmental Conditions
SPC01

SPECS GmbH
Multi-channel measurement platform
Quantum transport measurement system Nanonis Tramea
SPC09

SPECS GmbH
Super-Resolution Optical Microscopy NANORO
LIG01

LIGNANOWISE