- Home
- Products
- Application
- Semiconductor Display：Foreign Material Analysis
Semiconductor Display：Foreign Material Analysis
-
Non-contact measurement of elastic properties and spin waves in addition to chemical composition and molecular structureBrillouin-Raman Microspectrometer Nanofinder
- Demo
NF07
Tokyo Instruments Inc.
-
Imaging of functional and molecular features in deep tissue.
High resolution acoustic imaging meeting full flexibility of conventional microscopy.easyPAM Photoacoustic Microscopy, easySAM Acoustic Microscope
KI01
Kibero
-
High performance, Compact, Low cost Modular 3D Confocal RamanModular 3D Laser Raman Microspectroscopy System Nanofinder FLEX
NF02
Tokyo Instruments Inc.
-
Maximum sensitivity and spatial resolution. Scanning imaging system. Combined analytical technologies for sample study on micron/submicron level.3D Laser Raman Microspectroscopy system Nanofinder 30A (ADVANCED TYPE)
NF06
Tokyo Instruments Inc.
-
Best in the World Specifications3D Laser Raman Microspectroscopy System Nanofinder 30
NF05
Tokyo Instruments Inc.
-
3D Confocal Raman, 2 lasers, fiber based, AFM combinedModular 3D Laser Raman Microspectroscopy System Nanofinder FLEX2
NF04
Tokyo Instruments Inc.
-
High End Model for 3D Confocal Raman & TERS3D Laser Raman Microspectroscopy System Nanofinder HE
NF01
Tokyo Instruments Inc.
-
Ultra-sensitive fluorescence spectrophotometer, SNR:>35,000:1, Multiple light sources and detectors mountFLS1000 Photoluminescence Spectrometer
ED02
EDINBURGH INSTRUMENTS
-
Now it is possible to quickly and easily measure stress and structure in transparent materialsBirefringence Imaging system Exicor MicroImager
HN12
HINDS Instruments
-
-
-
-
No requirement to enter sample properties on particle analysisUltimate Particle Analyzer EyeTech
- Demo
- In Stock
AMV01
ambivalue
-
