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Analysis Equipments：Film Thickness Measurement
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Analyze the thickness of optical layers from 10 nm to ~250μmThin Film Reflectometry System, NanoCalc series
MP02
Ocean Optics BV(Mikropack)
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Measure polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelengthSpectral Ellipsometer System, SpecEL series
MP03
Ocean Optics BV(Mikropack)