The SpecEl-2000-VIS Ellipsometer measures polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelength. The SpecEl is controlled via a PC. Measure refractive index, absorbance and thickness with the touch of a button. The SpecEl houses an integrated light source, a spectrometer and two polarizers fixed to 70°. It also includes a PC with a 32-bit Windows operating system. The SpecEl can detect a single layer as thin as 0.1 nm and up to 5μm thick. In addition, it can provide refractive indices to 0.005°. In SpecEl Software, you can configure and save experiment method files for one-step analysis. after creating a "recipe," you can select the recipe to execute the experiment.
|Wavelength range||300-1000 nm||400-1000 nm|
|Optical resolution||1 nm|
|Angle of incidence||70°|
|Film thickness||1 nm - 10 μm|
|Beam diameter||400 x 1200 μm|
|Measurement speed||7 - 13 seconds|
|Last Updated||Update Information||Size||Download|