Hinds Instruments introduces the latest and most advanced Mueller Matrix Polarimeter System for challenging research and industrial process applications requiring ultra high sensitivity and repeatability in distinguishing specific, low level Mueller Matrix elements. The new Exicor®XT series 4 PEM Mueller Polarimeter system, developed by our Applications Research Group in a joint project with the Kahr group of NYU, has delivered best-in-class solutions to leading customers in Optics research, Crystals research, Flat Panel Display and Optical Lithography Applications. These include applications requiring the measurement of All 16 Mueller matrix elements, Low-level linear and circular retardation, with minimal interaction between them, All 6 polarization parameters (linear retardation - magnitude and angle; circular retardation - magnitude; linear diattenuation - magnitude and angle; and circular diattenuation - magnitude) of DUV light, with minimal interaction between them. Linear and circular retardation, where there is significant interaction between them.
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