Oblique incident angle birefringence measurement system for parallel faced optics and curved optics
Oblique incident angle birefringence measurement system "Exicor OIA"

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The HindsTM Instruments Exicor® OIA is the Premier Birefringence Measurement System for the evaluation of Lenses, Parallel Faced Optics and Curved Optics at normal and oblique incident angles. The system is built on Hinds Instruments award winning Photoelastic Modulator (PEM) based Exicor Birefringence Measurement technology. This next generation birefringence measurement system is providing the industry with new capabilities in the analysis and development of next generation lithographic lenses, lens blank and high value precious optics.

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